@article {loupis1995applicability,
	title = {The applicability of logarithmic extreme value distributions in electomigration induced failures of AlCu thin-film interconnects},
	journal = {Microelectronics Reliability},
	volume = {35},
	number = {3},
	year = {1995},
	pages = {611{\textendash}617},
	publisher = {Pergamon},
	author = {Loupis, MI and Avaritsiotis, JN}
}
