@article {loupis1994comparative,
	title = {Comparative study of statistical distributions in electromigration-induced failures of Al/Cu thin-film interconnects},
	journal = {Active and passive electronic components},
	volume = {16},
	number = {2},
	year = {1994},
	pages = {119{\textendash}126},
	publisher = {Hindawi},
	author = {Loupis, MI and Avaritsiotis, JN and Tziallas, GD}
}
