@conference {loupis1995simulated,
	title = {Simulated tests of large samples indicate a logarithmic extreme value distribution in electromigration induced failures of thin film interconnects},
	booktitle = {RELECTRONIC 1995 Budapest},
	year = {1995},
	pages = {353{\textendash}358},
	publisher = {Conference Proceedings},
	organization = {Conference Proceedings},
	author = {Loupis, Michael and Avaritsiotis, John}
}
