@conference {27606,
	title = {Probability distribution modelling of electromigration induced failure times},
	year = {1991},
	month = {1991},
	pages = {259 - 262},
	publisher = {IEEE},
	organization = {IEEE},
	isbn = {0879426551},
	author = {Loupis, MI and Avaritsiotis, JN}
}
