@article {27608,
	title = {The applicability of logarithmic extreme value distributions in electomigration induced failures of AlCu thin-film interconnects},
	volume = {35},
	year = {1995},
	month = {1995},
	pages = {611 - 617},
	publisher = {Pergamon},
	isbn = {0026-2714},
	author = {Loupis, MI and Avaritsiotis, JN}
}
