@article {27609,
	title = {Comparative study of statistical distributions in electromigration-induced failures of Al/Cu thin-film interconnects},
	volume = {16},
	year = {1994},
	month = {1994},
	pages = {119 - 126},
	publisher = {Hindawi},
	isbn = {0882-7516},
	author = {Loupis, MI and Avaritsiotis, JN and Tziallas, GD}
}
