@conference {27611,
	title = {Statistical distributions of electromigration induced failures and their impact on reliability prediction and design},
	volume = {1},
	year = {1995},
	month = {1995},
	pages = {235 - 239},
	publisher = {IEEE},
	organization = {IEEE},
	isbn = {0780327861},
	author = {Loupis, MI and Avaritsiotis, JN}
}
