TY - JOUR T1 - Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film JF - Applied Physics Letters Y1 - 2003 A1 - Labardi, M. A1 - Polop, C. A1 - V. Likodimos A1 - Pardi, L. A1 - Allegrini, M. A1 - Vasco, E. A1 - Zaldo, C. AB - Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film was studied. Polarization switching of the domains comprising the deformed region demonstrated the possibility of using scanning force microscopy (SFM) as a nanoscale tool for imaging phase transitions. It was found that if loading forces are higher than a threshold value, thin film characterization becomes invasive. VL - 83 UR - https://www.scopus.com/inward/record.uri?eid=2-s2.0-0141886152&doi=10.1063%2f1.1606100&partnerID=40&md5=aff3d0875f76b1a66576d43688d3b7ef N1 - cited By 13 ER -