%0 Journal Article %J Applied Physics Letters %D 2003 %T Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film %A Labardi, M. %A Polop, C. %A V. Likodimos %A Pardi, L. %A Allegrini, M. %A Vasco, E. %A Zaldo, C. %X Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film was studied. Polarization switching of the domains comprising the deformed region demonstrated the possibility of using scanning force microscopy (SFM) as a nanoscale tool for imaging phase transitions. It was found that if loading forces are higher than a threshold value, thin film characterization becomes invasive. %B Applied Physics Letters %V 83 %P 2028-2030 %G eng %U https://www.scopus.com/inward/record.uri?eid=2-s2.0-0141886152&doi=10.1063%2f1.1606100&partnerID=40&md5=aff3d0875f76b1a66576d43688d3b7ef %R 10.1063/1.1606100