<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Labardi, M.</style></author><author><style face="normal" font="default" size="100%">Polop, C.</style></author><author><style face="normal" font="default" size="100%">V. Likodimos</style></author><author><style face="normal" font="default" size="100%">Pardi, L.</style></author><author><style face="normal" font="default" size="100%">Allegrini, M.</style></author><author><style face="normal" font="default" size="100%">Vasco, E.</style></author><author><style face="normal" font="default" size="100%">Zaldo, C.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film</style></title><secondary-title><style face="normal" font="default" size="100%">Applied Physics Letters</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2003</style></year></dates><urls><web-urls><url><style face="normal" font="default" size="100%">https://www.scopus.com/inward/record.uri?eid=2-s2.0-0141886152&amp;doi=10.1063%2f1.1606100&amp;partnerID=40&amp;md5=aff3d0875f76b1a66576d43688d3b7ef</style></url></web-urls></urls><number><style face="normal" font="default" size="100%">10</style></number><volume><style face="normal" font="default" size="100%">83</style></volume><pages><style face="normal" font="default" size="100%">2028-2030</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film was studied. Polarization switching of the domains comprising the deformed region demonstrated the possibility of using scanning force microscopy (SFM) as a nanoscale tool for imaging phase transitions. It was found that if loading forces are higher than a threshold value, thin film characterization becomes invasive.</style></abstract><notes><style face="normal" font="default" size="100%">cited By 13</style></notes></record></records></xml>