Demopoulos C, Miliaraki N, KARKANIS S, Parthenis K, Kaplanis A, Loupis M, Dimitriadis B.
A machine vision PCB inspection system supported by parallel multitransputer architecture. In: Springer-Verlag, ISBN 1-854423-040-9; 1989. pp. 321 - 332.
Loupis MI, Avaritsiotis JN.
Electromigration phenomena in metal films: An extended survey. 1989;(Report: NTUA/ESPRIT 2016/0044/20.12.89).
Demopoulos C, Miliaraki N, KARKANIS S, Parthenis K, Kaplanis A, Loupis M, Dimitriadis B.
A machine vision PCB inspection system supported by parallel multitransputer architecture. In: 5th CIM Europe Conference, Athens. Springer-Verlag, ISBN 1-854423-040-9; 1989. pp. 321–332.
