Stress evolution in magnetron sputtered Ti-Zr-N and Ti-Ta-N films studied by in situ wafer curvature: Role of energetic particles

Citation:

Abadias G, Koutsokeras LE, Guerin P, Patsalas P. Stress evolution in magnetron sputtered Ti-Zr-N and Ti-Ta-N films studied by in situ wafer curvature: Role of energetic particles. Thin Solid Films [Internet]. 2009;518(5):1532 - 1537.

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Cited By :48Export Date: 27 April 2023

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