High spectral resolution optical image analysis as a tool for elucidating major extensional structures in detailed geological mapping

Vassilakis, E; Soukis, K.; Lozios, S.

High spectral resolution optical image analysis as a tool for elucidating major extensional structures in detailed geological mapping

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Vassilakis E, Soukis K, Lozios S. High spectral resolution optical image analysis as a tool for elucidating major extensional structures in detailed geological mapping. In: 4^th EARSeL Workshop on Remote Sensing and Geology. Mykonos; 2012. pp. 81-87.

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Emmanuel Vassilakis

Associate Professor, Geology and Geoenvironment

High spectral resolution optical image analysis as a tool for elucidating major extensional structures in detailed geological mapping

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