Statistical distributions of electromigration induced failures and their impact on reliability prediction and design
Citation:
Loupis MI, Avaritsiotis JN. Statistical distributions of electromigration induced failures and their impact on reliability prediction and design. In: Vol. 1. IEEE; 1995. pp. 235 - 239.
Department of Agricultural Development, Agri-Food and Natural Resources Management National and Kapodistrian University of Athens Evripou Campus, Office AΓ08-09 Tel. +30 22280 21906, Mob. +30 697 715 4332 Psachna, ZipCode 344 00 mloupis@uoa.gr
