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Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film

Citation:

Labardi M, Polop C, Likodimos V, Pardi L, Allegrini M, Vasco E, Zaldo C. Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film. Applied Physics Letters [Internet]. 2003;83:2028-2030.

Abstract:

Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film was studied. Polarization switching of the domains comprising the deformed region demonstrated the possibility of using scanning force microscopy (SFM) as a nanoscale tool for imaging phase transitions. It was found that if loading forces are higher than a threshold value, thin film characterization becomes invasive.

Notes:

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