Publications by Year: 1994

1994
Loupis MI, Avaritsiotis JN, Tziallas GD. Comparative study of statistical distributions in electromigration-induced failures of Al/Cu thin-film interconnects. 1994;16(2):119 - 126.
Loupis MI, Avaritsiotis JN, Tziallas GD. Comparative study of statistical distributions in electromigration-induced failures of Al/Cu thin-film interconnects. Active and passive electronic components. 1994;16:119–126.