HOME / PUBLICATIONS /

Core Shell Spectroscopy of Rapidly Oxidised Porous Silicon. Linking the Chemical and Electronic Structure

Citation:

Bancert U, Gardelis S, Hamilton B, Pettifer R. Core Shell Spectroscopy of Rapidly Oxidised Porous Silicon. Linking the Chemical and Electronic Structure. physica status solidi (b) [Internet]. 1995;190:69-76.

Abstract:

High resolution scanning transmission electron microscopy (STEM) and synchrotron X‐ray excitation of luminescence (XEOL) is used to probe the chemical nature of the luminescence mechanisms of porous and rapidly oxidised porous silicon. It is concluded that for fresh porous silicon, Si‐Si bonded material is involved in the luminescence. For oxidised material this is probably not the case, the chemical environment being SiO2. Copyright © 1995 WILEY‐VCH Verlag GmbH & Co. KGaA

Notes:

cited By 6

Website